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Performance Testing

determines degree of ability.

See Also: Conformance, Qualification, Benchmark, Failure Analysis


Showing results: 751 - 765 of 1034 items found.

  • Bidirectional Programmable DC Power Supply

    IT6000C Series - I-TECH Electronic Co., Ltd

    The bi-directional programmable DC power supply of IT6000C series combines two devices in one: a power supply (source) and an electronic load (sink) with energy recovery. Based on these two functions, IT6000C offers the functionalityof two-quadrant operation. The regenerative capability enables the energyconsumed to be put back onto the grid cleanly, saving costs from energyconsumption and cooling, while not interfering with the grid. IT6000C seriesprovide 7 voltage grades, max. output voltage up to 2250V, support master-slaveparalleling with averaging current distribution, max. output power up to1.152MW. Built-in waveform generator supports generating arbitrary waveforms,and import LIST files for waveforms via front panel USB port. IT6000C is thecombination of high reliability, high efficient setting, safe and multiplemeasurement functions. IT6000C is a family of bi-directional, regenerativepower system with excellent performance, extensively used in aspects of highpower battery, automotive electronics, green energy, high speed testing etc.

  • High Voltage 50 Ω Pulse Generator

    TLP-3010C - High Power Pulse Instruments GmbH

    *Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components

  • Memory Test System

    T5833/T5833ES - Advantest Corp.

    T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.

  • High Voltage 50 Ω Pulse Generator

    TLP-4010C - High Power Pulse Instruments GmbH

    *Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV*High pulse output current up to ±40 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components

  • Tactical Grade Inertial Measurement Unit (IMU)

    ADIS16490 iSensor - Analog Devices Inc.

    The ADIS16490 iSensor® device is a complete inertial system that includes a triaxial gyroscope and a triaxial accelerometer. Each inertial sensor in the ADIS16490 combines industry-leading iMEMS® technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyroscope bias). As a result, each sensor has its own dynamic compensation formulas that provide accurate sensor measurements. The ADIS16490 provides a simple, cost-effective method for integrating accurate, multiaxis inertial sensing into industrial systems, especially when compared with the complexity and investment associated with discrete designs. All necessary motion testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. The SPI and register structure provide a simple interface for data collection and configuration control.

  • Climatic Chamber

    Wewon Environmental Chambers Co, Ltd.

    Climatic chamber is designed to do high temperature & high humidity, high and low temperature, or temperature cycling test, Climatic chamber mainly used for quality checking and assessing their quality reliability and life test. ● The climatic chamber simulate a full range of temperature testing and humidity testing conditions.These chambers are designed for ease-of-use, reliability and performance and include many user-friendly features standard with your purchase for the best value in the industry. ● Climatic test chambers are able to provide rapid product temperature change rates and use varying levels of relative humidity to locate design problems prior to shipping your products, improving product quality and reliability. climatic chamber For conditioning of samples prior to testing. Climatic chamber also can be used for a variety of materials of high – low temperature alternating test. The test temperature, humidity, time can be programmed. Provides conditions of temperature form -70 degree to +150 degree and of humidity from 20% to 98%. ● This type climatic chamber use 16bit Industry-grade PLC, programmable controller to control the test temperature test, and recycle time, more excellent anti jamming, high reliability of the data. ● TEMI880 large color LCD touched screen temperature & humidity controller. Real-time display program running time, the number of segment, the remaining time, repeat frequency,can display experimental data, including the pre-set segment time, heating status, calendar time, etc; climatic chamber directly digital display. ● Climatic chambers apply controllable silicon step-less adjusting technology to adjust temperature and humidity test continuously and precisely, and without over heated as the PID adjusting function. ● The thermal insulation material between outside and inside for climatic chamber is high-quality ultra-fine glass fiber insulation cotton, good thermal insulation effectivity. Thermal insulation layer composed of flame fire PU + glass wool insulation (insulation thickness 10.0 cm)

  • Inbuilt External Controller ATE with Touch Screen Features

    QT 200NXT - Qmax Test Technologies Pvt. Ltd.

    QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture

  • Regenerative Power System

    IT6000B Series - I-TECH Electronic Co., Ltd

    From the perspective of improving customer experience, ITECH launches a new incorporated product--IT6000B series. IT6000B integrates bidirectional power supply and regenerative electronic load into one 3U unit. It is also a very powerful one. Only a button is needed to switch between the bidirectional power supply and the regenerative electronic load. It can be used not only as a stand-alone powerful bidirectional power supply, as a source to provide power; but also as an independent regenerative electronic load, to absorb the consumed energy and feedback cleanly to the grid. IT6000B offers standard two-quadrants functionality. IT6000B provides 7 voltage ranges, up to 2250V, supports master-slave parallel with even current distribution up to 1152kW. Built-in waveform generator supports generating arbitrary waveforms, and imports LIST files for waveforms via USB interface. IT6000B is the combination of reliability, high efficient setting, safe and multiple measurement functions. IT6000B is a family of bi-directional, regenerative power system with excellent performance, extensively used in aspects of high power battery, automotive electronics, green energy, high speed testing etc.

  • High Voltage 50 Ω Pulse Generator

    TLP-8010A - High Power Pulse Instruments GmbH

    *Wafer and package level TLP/HMM testing*Fast 50 Ω high voltage pulse output with typical 300 ps rise time*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω-configuration*High pulse output current up to ±80 A (short circuit) with 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 300 ps to 50 ns*1 built-in pulse width: 100 ns*Optional external pulse width extensions 5/10/50/100/200/500 ns using an external pulse width extender TLP-8012A5*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components

  • High Temperature Self-Supporting Furnace Extensometers (1200 C)

    Model 3448 - Jinan Testing Equipment IE Corporation

    Epsilon developed this unique high temperature extensometer for testing metals, ceramics, and composites at the high temperatures produced by furnaces and induction heating systems. A combination of features make these extensometers easier to use and better in performance than other similar high temperature extensometers.The units are held on the specimen by light, flexible ceramic fiber cords. These make the extensometer self-supporting on the specimen. No furnace mounting brackets are required. The side load on the test sample is greatly reduced because of the self-supporting design and light weight of the sensor. Most materials testing furnaces with a side cut-out for an extensometer will readily accept a Model 3448. For induction heating systems, a different ceramic cord placement allows the extensometer to easily pass between the coils.The combination of radiant heat shields and convection cooling fins allow this model to be used at specimen temperatures up to 1200℃ (2200°F) without any cooling. An optional tiny air fan does enhance stability at the highest temperatures and is recommended for the highest accuracy and for tests with small elongations. The fan comes with a magnetic base for support so it can be mounted at any convenient location near the extensometer. Fan cooling is not generally needed for induction heated systems. High purity alumina ceramic rods are used. These are available in lengths as required to fit your furnace. A spare set is included with every extensometer. Specify chisel, vee chisel or conical contact points as desired.Most units operate equally well in tension and compression. Thus tensile, compression and cyclic tests like low cycle fatigue can all be performed with a single unit.For vacuum furnaces, special models are available. Epsilon can also provide a radiant heat transfer cooled version. This requires that the extensometer module be surrounded by a water cooled enclosure with a front slot for the ceramic rods.

  • ±6 kV ANSI/ESDA/JEDEC HBM Test System

    HBM-TS10-A - High Power Pulse Instruments GmbH

    *±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C

  • EMI Receiver

    KH3935 - Beijing KeHuan Century EMC Technology Co,.LTD

    KH3935 type EMI test receiver interference test receiver is fully automatic, is EMI major tool for testing. The frequency range of the KH3935 receiver is from 9kHz to 30MHz , which satisfies the power line disturbance power test. After configuring the artificial power network, the power terminal disturbance voltage test can be performed. The machine has fast test speed, strong maneuverability, stable performance, Advantages such as convenient test data processing. The KH3935 receiver uses a USB interface for data transmission, and supports USBinterface peripheral devices such as printers, mice, keyboards, etc. The machine is equipped with a high-speed and large-capacity hard disk, which stores a variety of external device data, and supports plug and play. External test equipment. The software is self-developed by our company, using windows as the carrier, users who are familiar with the operation of windows can quickly get started. The machine can independently carry out test work without additional control equipment for control operations, which fundamentally solves the problem of interference sources. The measurement results can be input to the hard disk in the receiver or stored in a floppy disk through a floppy drive or printed out directly or savedusing a USB storage device. The detailed measurement report can be printed directly according to user needs without additional editing.

  • EMI Receiver

    KH3939 - Beijing KeHuan Century EMC Technology Co,.LTD

    KH3939 type EMI test receiver interference test receiver is fully automatic, is EMI major tool for testing. The frequency range of the KH3939 receiver is from 9kHz to 300MHz , which satisfies the power line disturbance power test. After configuring the artificial power network, the power terminal disturbance voltage test can be carried out. The machine has fast test speed, strong maneuverability, stable performance, Advantages such as convenient test data processing. The KH3939 receiver uses a USB interface for data transmission, and supports USBinterface peripheral devices such as printers, mice, keyboards, etc. The machine is equipped with a high-speed and large-capacity hard disk, which stores a variety of external device data, and supports plug and play. External test equipment. The software is self-developed by our company, using windows as the carrier, users who are familiar with the operation of windows can quickly get started. The machine can independently carry out test work without additional control equipment for control operations, which fundamentally solves the problem of interference sources. The measurement results can be input to the hard disk in the receiver or stored in a floppy disk through a floppy drive or printed out directly or savedusing a USB storage device. The detailed measurement report can be printed directly according to user needs without additional editing.

  • 10KV High Voltage Digital Insulation Resistance Tester

    KM 6213AIN - Kusam Electrical Industries Limited

    • The KM 6213A IN is the KUSAM-MECO premium model of High Voltage Digital Insulation Resistance Testers.• The KM 6213A IN has new added features with a low consumption High Performance processor.• It displays results much faster and has more advanced features.• The KM 6213A IN has Automatic Polarization Index and Dielectric Absorption Ratio Calculations.• Results are displayed on the new High Contrast LCD. It’s mounting angle makes it more readable for all users, in different working conditions.• The user’s manual reflects the new features and added benefits of this instrument.• It has Auto-Off, Auto-Stop, EnerSave™ and is a non destructive tester.• Once you start the tester, it waits for your selection. You can go up and down in voltage to select the voltage at which you want to test the insulation. Once you have selected that voltage, you need to connect the test leads to the Insulation Tester to measure. Then it measures voltage to ensure there is no voltage present on the equipment under test. If there is a voltage present, it will warn you to disconnect the circuit before proceeding. If it’s free of any voltage, then you can proceed with the testing. This ensures that no damage is done to the Insulation Tester KM 6213AIN.• One of the new innovation on this tester is also the way the new unique calibration process works. It’s fully digital, has no moving parts and does not require expensive and complicated jigs or computers systems to be calibrated. It’s cheaper to maintain than any other Digital HV Insulation tester on the market today. The KM 6213AIN is supplied standard with our Premium test Leads Kit, the AL-50.

  • High Voltage 50 Ω Pulse Generator

    TLP-8010C - High Power Pulse Instruments GmbH

    *Wafer and package level TLP/VF-TLP/HMM testing*Combines TLP-8010A and TLP-4010C into one system*Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders*Ultra fast 50 Ω high voltage pulse output with typical rise time 100 ps (0-40 A) and 300 ps (> 40 A)*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω configuration*High pulse output current up to ±80 A (short circuit) with minimum 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns (0-40 A), 1 built-in pulse width: 100 ns (> 40 A)*The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0-40 A)*Optional external pulse width extensions from 5 ns to 500 ns (> 40…80 A) using the external pulse width extender TLP-8012A5*Built-in pulse reflection suppression*Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components

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